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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Transmission Electron Microscopy and Diffractometry of Materials - Graduate Texts in Physics
Author: Brent Fultz, James Howe
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the t...  more »
ISBN-13: 9783642297601
ISBN-10: 3642297609
Publication Date: 10/14/2012
Pages: 781
Edition: 4th ed. 2013
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Publisher: Springer
Book Type: Hardcover
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