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Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author: Brent Fultz, James Howe
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer...  more »
ISBN-13: 9783540738855
ISBN-10: 3540738851
Publication Date: 12/4/2007
Pages: 758
Edition: 3rd
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Publisher: Springer
Book Type: Hardcover
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