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Technical Risk Management - 2007 Edition (Managing Technology Series, Volume I)
Technical Risk Management 2007 Edition - Managing Technology Series, Volume I
Author: J. Wayne McCain, Jack V. Michaels
Dr. Jack Michael's manuscript with additional information provided by Dr. J. Wayne McCain including case studies, statistics review, problem sets, and statistical tables. Recognized 'standard' for defining and managing technical risks. Includes qualitative and quantitative methodologies. College algebra and introductory statistics recommended pr...  more »
ISBN-13: 9780979063701
ISBN-10: 0979063701
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Publisher: By Design Unlimited
Book Type: Spiral-bound
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