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Scanning Electron Microscopy and X-Ray Microanalysis
Scanning Electron Microscopy and XRay Microanalysis
Author: Joseph Goldstein, Dale Newbury, David C. Joy, Joseph Michael, Nicholas W.M. Ritchie, John Henry Scott
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion bea...  more »
ISBN-13: 9781493966745
ISBN-10: 149396674X
Publication Date: 12/24/2016
Pages: 700
Edition: 4th ed. 2017
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Publisher: Springer
Book Type: Hardcover
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