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Ion Beam Analysis: Fundamentals and Applications
Ion Beam Analysis Fundamentals and Applications
Author: Michael Nastasi, James W. Mayer, Yongqiang Wang
This book provides a complete resource for practitioners using ion beam analysis. It explains basic characteristics of ion beams as applied to the analysis of materials, as well as IBA of art/archaeological objects. The book covers both how ions interact with solids and also what information can be gained. The contents follow a straightforward o...  more »
ISBN-13: 9781439846384
ISBN-10: 1439846383
Publication Date: 8/15/2014
Pages: 350
Edition: 1
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Publisher: Crc Pr I Llc
Book Type: Hardcover
Members Wishing: 0
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