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Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
Foundations of Measurement Vol 2 Geometrical Threshold and Probabilistic Representations
Author: Patrick Suppes, David H. Krantz, R. Duncan Luce, Amos Tversky
Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Founda...  more »
ISBN-13: 9780124254022
ISBN-10: 0124254020
Publication Date: 11/11/1989
Pages: 493
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Publisher: Academic Press
Book Type: Hardcover
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