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Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM
Electron NanoImaging Basics of Imaging and Diffraction for TEM and STEM
Author: Nobuo Tanaka
In this book, the bases of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in the style of a textbook. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowled...  more »
ISBN-13: 9784431565000
ISBN-10: 4431565000
Publication Date: 3/5/2017
Pages: 335
Edition: 1st ed. 2017
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Publisher: Springer
Book Type: Hardcover
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