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Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
This is a clear and up-to-date account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of ea...  more »
ISBN-13: 9780521031707
ISBN-10: 0521031702
Publication Date: 11/23/2006
Pages: 406
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Publisher: Cambridge University Press
Book Type: Paperback
Members Wishing: 0
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