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Advanced Production Testing of RF, SoC, and SiP Devices
Advanced Production Testing of RF SoC and SiP Devices
Author: Joe Kelly, Michael D. Engelhardt
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconducto...  more »
ISBN-13: 9781580537094
ISBN-10: 158053709X
Publication Date: 10/31/2006
Pages: 326
Edition: 1
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Publisher: Artech House Publishers
Book Type: Hardcover
Members Wishing: 0
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